On Detection, Analysis and Characterization of Transient and Parametric Failures in Nano-scale CMOS VLSI

نویسندگان

  • Alodeep Sanyal
  • Kunal Ganeshpure
  • Aswin Sreedhar
  • Ashesh Rastogi
  • Wei Chen
  • Abhisek Pan
  • Michael Buttrick
چکیده

ON DETECTION, ANALYSIS AND CHARACTERIZATION OF TRANSIENT AND PARAMETRIC FAILURES IN NANO-SCALE CMOS VLSI

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تاریخ انتشار 2014